Osaka, Japan

Shinya Ikejiri

This inventor holds 2 USPTO granted patents. Top assignee: Rigaku Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinya Ikejiri. Retrieved from https://idiyas.com/inventor/shinya-ikejiri

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Shinya Ikejiri: Innovator in X-ray Emission Spectrochemical Analysis

Introduction

Shinya Ikejiri is a notable inventor based in Osaka, Japan. He has made significant contributions to the field of x-ray emission spectrochemical analysis. With a total of 2 patents to his name, Ikejiri continues to push the boundaries of innovation in his area of expertise.

Latest Patents

Ikejiri's latest patents include a measuring device specifically designed for x-ray emission spectrochemical analysis. This invention showcases his commitment to advancing analytical techniques and improving measurement accuracy in scientific research.

Career Highlights

Shinya Ikejiri is currently employed at Rigaku Corporation, a leading company in the field of analytical and measurement instruments. His work at Rigaku has allowed him to collaborate with other talented professionals and contribute to groundbreaking advancements in technology.

Collaborations

Throughout his career, Ikejiri has worked alongside esteemed colleagues such as Hikari Takahara and Kenji Ikesaka. These collaborations have fostered a creative environment that encourages innovation and the development of new technologies.

Conclusion

In summary, Shinya Ikejiri is a prominent inventor whose work in x-ray emission spectrochemical analysis has led to valuable advancements in the field. His contributions continue to inspire future innovations and enhance scientific understanding.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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