Tokyo, Japan

Shintaro Yoshii


Average Co-Inventor Count = 3.3

ph-index = 2

Forward Citations = 67(Granted Patents)


Company Filing History:


Years Active: 1989-1991

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3 patents (USPTO):Explore Patents

Title: Shintaro Yoshii: Innovator in Semiconductor Technology

Introduction

Shintaro Yoshii is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor technology, holding three patents that showcase his innovative approach to solving complex problems.

Latest Patents

One of his latest patents is an impurity measuring method. This method involves dropping a hydrophobic liquid onto the surface of an object to be measured. The drop is then moved to ensure contact with the entire surface. After this movement, the drop is recovered and analyzed through chemical analysis to determine the type and content of impurities adsorbed on the surface. Another notable patent is a gettering method for semiconductor wafers. In this method, ultrasonic waves are propagated along the surface of a semiconductor wafer through pure water. This process creates mechanical damages on the surface, which serve as back side damage, enhancing the wafer's performance.

Career Highlights

Shintaro Yoshii is currently employed at Kabushiki Kaisha Toshiba, a leading company in technology and electronics. His work at Toshiba has allowed him to apply his innovative ideas in practical applications, contributing to advancements in semiconductor technology.

Collaborations

He collaborates with talented coworkers, including Ayako Maeda and Mokuji Kageyama. Their combined expertise fosters a creative environment that drives innovation within their projects.

Conclusion

Shintaro Yoshii's contributions to semiconductor technology through his patents and work at Toshiba highlight his role as a key innovator in the field. His methods for measuring impurities and enhancing semiconductor wafers demonstrate the impact of his research and development efforts.

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