This inventor holds 1 USPTO granted patent. Top assignee: National Institute of Advanced Industrial Science and Technology. Active years: 2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015
Title: Shinsuke Yamaguchi: Innovator in Semiconductor Inspection Technology
Introduction
Shinsuke Yamaguchi is a prominent inventor based in Kumamoto, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the area of defect inspection. His innovative methods have the potential to enhance the quality control processes in semiconductor manufacturing.
Latest Patents
Yamaguchi holds a patent for a "Method for inspecting defects, inspected wafer or semiconductor device manufactured using the same, method for quality control of wafers or semiconductor devices and defect inspecting apparatus." This patent describes a technique where light from a light source device is polarized through a polarizer and directed obliquely onto an object to be inspected. The scattered light is then captured by a CCD imaging device, which has an element for separating scattered polarized light in a dark field. The method involves calculating component light intensities for both P-polarized and S-polarized component images, allowing for the determination of polarization direction based on their ratio. This process is crucial for comparing the component light intensities and polarization directions against predetermined threshold values, thereby improving defect detection in semiconductor devices.
Career Highlights
Shinsuke Yamaguchi is affiliated with the National Institute of Advanced Industrial Science and Technology, where he continues to advance research in semiconductor technologies. His work has been instrumental in developing methods that enhance the reliability and efficiency of semiconductor manufacturing processes.
Collaborations
Yamaguchi has collaborated with notable colleagues such as Kazufumi Sakai and Kazuhiro Nonaka. These partnerships have fostered innovation and contributed to the advancement of semiconductor inspection technologies.
Conclusion
Shinsuke Yamaguchi's contributions to semiconductor inspection technology exemplify the importance of innovation in enhancing manufacturing processes. His patented methods are paving the way for improved quality control in the semiconductor industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
