Aichi, Japan

Shinsuke Watanabe

This inventor holds 2 USPTO granted patents. Top assignee: Nippondenso Co., Ltd.. Active years: 1993-1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinsuke Watanabe. Retrieved from https://idiyas.com/inventor/shinsuke-watanabe-qk35co5m

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.7

ph-index = 2

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 1993-1996

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2 patents (USPTO):Explore Patents

Title: Shinsuke Watanabe: Innovator in Semiconductor Technology

Introduction

Shinsuke Watanabe is a prominent inventor based in Aichi, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 2 patents. His work focuses on improving the sensitivity and efficiency of semiconductor sensors.

Latest Patents

Watanabe's latest patents include a method of producing a semiconductor dynamic sensor and a method of producing an acceleration sensor of a semiconductor. The first patent describes a method that enhances sensitivity while maintaining a compact size, avoiding damage to the thin distortion-producing portion during production. The second patent outlines a process for creating an acceleration sensor using piezo resistance layers formed in a silicon tip, utilizing advanced etching techniques.

Career Highlights

Watanabe is associated with Nippondenso Co., Ltd., where he has been instrumental in developing innovative semiconductor technologies. His expertise has led to advancements that benefit various applications in the electronics industry.

Collaborations

Some of his notable coworkers include Masakazu Terada and Minoru Nishida, who have collaborated with him on various projects within the company.

Conclusion

Shinsuke Watanabe's contributions to semiconductor technology demonstrate his commitment to innovation and excellence in the field. His patents reflect a deep understanding of the complexities involved in sensor production, paving the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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