Katsuta, Japan

Shinji Seki

This inventor holds 1 USPTO granted patent. Top assignees: Hitachi Information Control Systems, Inc., Hitachi, Ltd.. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinji Seki. Retrieved from https://idiyas.com/inventor/shinji-seki-5dv4kts8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 38(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Shinji Seki

Introduction

Shinji Seki is a notable inventor based in Katsuta, Japan. He has made significant contributions to the field of topographic processing through his innovative patent. His work has implications for various applications, particularly in mapping and data analysis.

Latest Patents

Shinji Seki holds a patent for an "Apparatus and method for topographic processing." This invention involves storing a plurality of maps at different scales, allowing users to select an appropriate map for analysis. The method enables the investigation of map data to derive information that meets specific criteria, ensuring that satisfactory cross sections can be obtained even when initial data is insufficient.

Career Highlights

Throughout his career, Shinji Seki has worked with prominent companies such as Hitachi, Ltd. and Hitachi Information Control Systems, Inc. His experience in these organizations has contributed to his expertise in technology and innovation.

Collaborations

Shinji Seki has collaborated with notable coworkers, including Makoto Ibusuki and Yasuei Nomoto. These partnerships have likely enriched his work and expanded the impact of his inventions.

Conclusion

Shinji Seki's contributions to topographic processing demonstrate his innovative spirit and commitment to advancing technology. His patent reflects a deep understanding of mapping and data analysis, showcasing the importance of his work in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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