The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 1995
Filed:
Jul. 24, 1992
Hitachi, Ltd., Tokyo, JP;
Hitachi Information Control Systems, Inc., Ibaraki, JP;
Abstract
For topographic processing, a plurality of maps are stored, the maps being of different scales and therefore being based on different amounts of map data. The user selects a map of appropriate scale, and can then select a part, for example a line, on which appropriate analysis is to be made, such as obtaining a cross section based on contour data of the map. The map data corresponding to the selected part of the map is investigated and, where it does not meet an appropriate criterion, the data of a part of a map of different scale is investigated, the part of the two maps corresponding to the same region. Hence information can be derived which meets the appropriate criterion. Thus, when obtaining a cross section, if the amount of data for a region of a map is insufficient for a satisfactory cross section to be obtained, the data of the same region of a map of larger scale is analyzed, so that a satisfactory cross section can be achieved. The processing is also applicable to the investigation of lines of sight, using the map data.