Hsinchu, Taiwan

Shih-Yung Chen

USPTO Granted Patents = 3 

Average Co-Inventor Count = 12.0

ph-index = 1


Company Filing History:


Years Active: 2020-2025

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3 patents (USPTO):Explore Patents

Title: Innovations of Shih-Yung Chen in Semiconductor Technology

Introduction

Shih-Yung Chen is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in defect detection methods. With a total of three patents to his name, Chen's work is instrumental in enhancing the efficiency and accuracy of semiconductor manufacturing processes.

Latest Patents

One of Chen's latest patents is a hot spot defect detecting method and system. This innovative method involves extracting hot spots from the design of a semiconductor product to create a hot spot map that comprises various hot spot groups. The method defines local patterns in the same context of the design that yield identical image content as a single hot spot group. During runtime, defect images obtained from an inspection tool performing hot scans on a wafer are aligned with the hot spot map to locate the hot spot groups. The detection of hot spot defects in each defect image is achieved by dynamically mapping the hot spot groups to multiple threshold regions and performing automatic thresholding on pixel values of the hot spots in the corresponding regions.

Career Highlights

Shih-Yung Chen is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work focuses on developing advanced methods for defect detection, which are crucial for maintaining high-quality standards in semiconductor production.

Collaborations

Chen collaborates with talented individuals in his field, including Chien-Huei Chen and Pei-Chao Su, who contribute to the innovative projects at Taiwan Semiconductor Manufacturing Company Limited.

Conclusion

Shih-Yung Chen's contributions to semiconductor technology through his innovative patents and collaborative efforts highlight his importance in the industry. His work continues to pave the way for advancements in defect detection methods, ensuring the production of high-quality semiconductor products.

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