Sunnyvale, CA, United States of America

Shih-tsun A Chou

This inventor holds 1 USPTO granted patent. Top assignee: Sequence Design, Inc.. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shih-tsun A Chou. Retrieved from https://idiyas.com/inventor/shih-tsun-a-chou

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Shih-tsun A Chou: Innovator in On-Chip Sheet Resistivity Measurement

Introduction

Shih-tsun A Chou is a notable inventor based in Sunnyvale, CA (US). He has made significant contributions to the field of semiconductor manufacturing, particularly in the measurement of on-chip sheet resistivity. His innovative approach has implications for improving manufacturing processes in the electronics industry.

Latest Patents

Shih-tsun A Chou holds a patent for a "Method for determining on-chip sheet resistivity." This method measures resistance in a test structure to determine the sheet resistivity of a conductor. In one embodiment, a family of test structures is provided to determine the effective sheet resistivity of a conductor as a function of its width. The method is particularly applicable to conductors in manufacturing processes where "slots" or "islands" are created in the conductor to prevent dishing during chemical-mechanical polishing. He has 1 patent to his name.

Career Highlights

Chou is currently employed at Sequence Design, Inc., where he continues to work on innovative solutions in semiconductor technology. His expertise in the field has made him a valuable asset to his team and the company.

Collaborations

Some of his coworkers include Abhay Dubey and Keh-Jeng Chang, who collaborate with him on various projects within the company.

Conclusion

Shih-tsun A Chou's contributions to the measurement of on-chip sheet resistivity highlight his innovative spirit and dedication to advancing semiconductor technology. His work continues to influence the industry and improve manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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