Shih-Fang Lee

Title: Innovations of Shih-Fang Lee in Surface Profilometry

Introduction

Shih-Fang Lee is an accomplished inventor based in Hsinchu, Taiwan. He is known for his significant contributions to the field of surface profilometry, particularly through his innovative designs that enhance the capabilities of measuring surface profiles.

Latest Patents

One of Shih-Fang Lee's notable patents is the "Tilting Adjustable Surface Profilometer." This invention relates to a device that allows for the adjustment of the image acquiring angle. The apparatus consists of two types of frameworks. The first is a translation-stage-type tilting adjustable surface profilometer, which operates through the translations of two translation stages combined with the rotation of a rotary rack. This design enables the acquisition of surface profiles at an omni-directional angle of a sample. The second framework features a surface profilometer with an arc-trajectory tilting apparatus, which allows the device to slide along arc rails while rotating the rotary rack, thus obtaining surface profiles from various angles.

Career Highlights

Shih-Fang Lee is affiliated with the Industrial Technology Research Institute, where he continues to develop and refine his inventions. His work has significantly impacted the field of surface measurement technology, providing researchers and industries with advanced tools for precise surface analysis.

Collaborations

Shih-Fang Lee collaborates with talented individuals such as Shih-Hsuan Kuo and Ching-Ming Yeh, who contribute to the innovative environment at the Industrial Technology Research Institute.

Conclusion

Shih-Fang Lee's contributions to surface profilometry through his innovative patent demonstrate his commitment to advancing technology in this field. His work continues to influence the way surface profiles are measured and analyzed, showcasing the importance of innovation in engineering and research.