Tokyo, Japan

Shigezo Kudo

This inventor holds 1 USPTO granted patent. Top assignee: Tokyo Cathode Laboratory, Co., Ltd.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shigezo Kudo. Retrieved from https://idiyas.com/inventor/shigezo-kudo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 50(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Shigezo Kudo: Innovator in Probe Technology

Introduction

Shigezo Kudo is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of probe technology, particularly through his innovative designs that enhance the functionality and durability of probe cards.

Latest Patents

Kudo holds a patent for a multi-layered probe designed for a probe card. This invention features a probe shaft made of conductive metal, which is enclosed by a high Young's modulus covering layer. The design allows for a constant diameter at the contact portion, ensuring reliable electric connection measurements on test bodies. The covering layer is engineered to withstand repeated stresses, making it a robust solution for various testing applications.

Career Highlights

Shigezo Kudo is associated with Tokyo Cathode Laboratory, Co., Ltd., where he has been instrumental in advancing probe technology. His work has not only improved the efficiency of testing processes but has also set new standards in the industry.

Collaborations

Kudo collaborates with fellow inventor Toshihiro Matsuo, contributing to the development of innovative solutions in their field. Their partnership has fostered a creative environment that encourages the exploration of new ideas and technologies.

Conclusion

Shigezo Kudo's contributions to probe technology exemplify the spirit of innovation. His patented designs and collaborative efforts continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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