The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2003
Filed:
Mar. 24, 2000
Toshihiro Matsuo, Tokyo, JP;
Shigezo Kudo, Tokyo, JP;
Tokyo Cathode Laboratory Co., Ltd., Tokyo, JP;
Abstract
A probe ( ) for a probe card that has a multi-layered structure, in which a probe shaft ( ) is enclosed by a covering layer ( ). The probe shaft ( ) is made of conductive metal, and provided with a contact portion ( ) at a tip end for pressing onto a test body to measure electric connection of the test body. The contact portion ( ) is formed having a constant diameter, and retains the constant diameter even after being machined for reuse. The covering layer ( ) is made of a material having a high Young's modulus to help counter stresses repeatedly applied to the probe shaft ( ), and formed covering the entire external circumferential surface of the probe shaft ( ) except for the contact portion ( ). The tip end of the covering layer ( ) is tapered in order to deal with a test body with narrower pitches.