Nagaoka, Japan

Shigeru Tsuchida

This inventor holds 1 USPTO granted patent. Top assignee: System Seiko Co., Ltd.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shigeru Tsuchida. Retrieved from https://idiyas.com/inventor/shigeru-tsuchida-xv3fbbfb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Shigeru Tsuchida: Innovator in Disk Surface Inspection Technology

Introduction

Shigeru Tsuchida is a notable inventor based in Nagaoka, Japan. He has made significant contributions to the field of surface inspection technology, particularly for disks. His innovative approach has led to the development of a unique apparatus that enhances the efficiency and accuracy of disk surface inspections.

Latest Patents

Shigeru Tsuchida holds a patent for a "Method and apparatus of surface inspection of a disk." This apparatus features an indexing table equipped with chucks that hold disks at regular angular intervals. The design allows for the sequential movement of disks from a loading station to an inspection station, where they are thoroughly examined for surface defects. The disks are rotated to a predetermined rate of revolution before inspection, ensuring immediate and accurate assessments.

Career Highlights

Throughout his career, Tsuchida has been associated with System Seiko Co., Ltd., where he has played a pivotal role in advancing disk inspection technologies. His work has not only improved the quality control processes within the company but has also set new standards in the industry.

Collaborations

One of his notable collaborators is Tetsuya Iwata, with whom he has worked closely to refine and enhance their technological innovations.

Conclusion

Shigeru Tsuchida's contributions to disk surface inspection technology exemplify his commitment to innovation and quality. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to improving inspection processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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