The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2000
Filed:
Dec. 18, 1998
Tetsuya Iwata, Nagaoka, JP;
Shigeru Tsuchida, Nagaoka, JP;
System Seiko Co., Ltd., Niigata, JP;
Abstract
An apparatus for inspecting a surface of a disk comprises an indexing table having chucks for holding said disks respectively, said chucks being arranged angularly at regular intervals on the indexing table. Each of disks held by the respective chucks is moved by indexing revolution of the indexing table sequentially from a loading station where the disk is loaded onto the chuck, to an inspection station where the disk is inspected for a surface of the disk and then to an unloading station where the inspected disk is unloaded to the outside of the apparatus. The disk loaded onto a chuck at the loading station is driven to rotate until the disk gets to a predetermined rate of revolution before the disk arrives at the inspection station. The disk which has already get to the predetermined rate of revolution can be immediately inspected for the surface of the disk in the inspection station by an inspection device.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile