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Years Active: 2016-2025
Title: Shigeru Eura: Innovator in Semiconductor Inspection Technologies
Introduction
Shigeru Eura is a prominent inventor based in Hamamatsu, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 10 patents. His work focuses on innovative methods and devices for inspecting semiconductor devices, which are crucial for the advancement of electronic technologies.
Latest Patents
Eura's latest patents include a semiconductor device inspection method and a semiconductor device inspection apparatus. The inspection device he developed features a measuring device that supplies power to a semiconductor device and measures its electrical characteristics. It also includes an optical scanning device that scans the semiconductor with light intensity-modulated at various frequencies. A lock-in amplifier acquires a characteristic signal that indicates the electrical characteristics of these frequency components. The inspection device calculates a frequency at which the characteristic signals of different layers have a predetermined phase difference, allowing for precise analysis of the semiconductor's properties.
Another notable patent is for an ultrasonic testing device and method. This device targets packaged semiconductor devices and includes an ultrasonic oscillator facing the semiconductor. A pulse generator generates a driving signal to produce ultrasonic waves, while an analysis unit evaluates the output signal from the semiconductor in response to the ultrasonic wave. The pulse generator optimizes the frequency of the driving signal to maximize ultrasonic wave absorption in the semiconductor device.
Career Highlights
Shigeru Eura has worked with notable organizations such as Hamamatsu Photonics K.K. and Toyohashi University of Technology. His experience in these institutions has allowed him to develop and refine his innovative technologies in semiconductor inspection.
Collaborations
Eura has collaborated with talented individuals in his field, including Kazuya Iguchi and Kengo Suzuki. Their joint efforts have contributed to the advancement of semiconductor inspection technologies.
Conclusion
Shigeru Eura's contributions to semiconductor inspection technology through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence the development of advanced electronic devices.