Tokyo, Japan

Shigeru Aoshima

USPTO Granted Patents = 5 

 

Average Co-Inventor Count = 3.7

ph-index = 3

Forward Citations = 94(Granted Patents)


Company Filing History:


Years Active: 2006-2011

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5 patents (USPTO):Explore Patents

Title: Shigeru Aoshima: Innovator in Thermal and Flow Measurement Technologies

Introduction

Shigeru Aoshima is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the fields of thermal conductivity and flow measurement technologies. With a total of five patents to his name, Aoshima's work has had a considerable impact on various industrial applications.

Latest Patents

Aoshima's latest patents include a thermal conductivity measuring method and apparatus, as well as a gas component ratio measuring apparatus. The thermal conductivity measuring method involves calculating a heat radiation coefficient from a microheater, which is supported in air and provided in an ambient gas. This method allows for the determination of the thermal conductivity of the ambient gas based on a proportional relationship with the heat radiation coefficient. Additionally, his flow meter and flow volume controlling device are designed to reduce pressure loss while achieving a flow rectifying effect in measurement fluids. This innovative flow meter features a flow path with a flow rectifier that enhances the measurement accuracy of fluid flow.

Career Highlights

Shigeru Aoshima is currently associated with Yamatake Corporation, where he continues to develop and refine his inventions. His work at Yamatake has positioned him as a key player in advancing measurement technologies.

Collaborations

Aoshima has collaborated with notable colleagues, including Hiroyuki Inagaki and Yasuharu Ooishi. Their combined expertise has contributed to the successful development of innovative technologies in their respective fields.

Conclusion

Shigeru Aoshima's contributions to thermal and flow measurement technologies exemplify his innovative spirit and dedication to advancing industrial applications. His patents reflect a commitment to improving measurement accuracy and efficiency in various processes.

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