Funabashi, Japan

Shigeki Kaneko


Average Co-Inventor Count = 3.2

ph-index = 7

Forward Citations = 458(Granted Patents)


Location History:

  • Kounosu, JP (1992)
  • Funabashi, JP (2000 - 2003)
  • Yokohama, JP (2003)
  • Fujisawa, JP (2007)
  • Tokyo, JP (1998 - 2010)

Company Filing History:


Years Active: 1992-2010

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10 patents (USPTO):Explore Patents

Title: Shigeki Kaneko: Innovator in Electronic Device Testing

Introduction

Shigeki Kaneko is a prominent inventor based in Funabashi, Japan. He has made significant contributions to the field of electronic device testing, holding a total of 10 patents. His work focuses on improving the efficiency and accuracy of electronic device test apparatuses.

Latest Patents

Among his latest innovations is an electronic device test apparatus designed to optimize the pushing conditions for contact arms. This apparatus includes a contact arm that moves an integrated circuit (IC) device and pushes it against a socket. The system features a control device that manages the contact arm, an instructing unit that provides torque instructions, and an acquiring unit that collects test results. Additionally, a correction unit adjusts the torque based on the acquired test results, while a setting unit establishes the optimum stroke when the test results are normal. Another notable patent is the electronic device test system, which efficiently manages the testing of devices under specific conditions.

Career Highlights

Shigeki Kaneko has worked with notable companies such as Matsushita Electric Industrial Co., Ltd. and Advantest Corporation. His experience in these organizations has allowed him to refine his skills and contribute to advancements in electronic testing technologies.

Collaborations

Throughout his career, Kaneko has collaborated with talented individuals, including Ryota Tsukidate and Yoshiyasu Takeuchi. These partnerships have fostered innovation and enhanced the development of new technologies in the field.

Conclusion

Shigeki Kaneko's contributions to electronic device testing have made a significant impact on the industry. His innovative patents and collaborative efforts continue to drive advancements in technology.

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