Company Filing History:
Years Active: 2023
Title: Innovations of Shi Min Pan in Nondestructive Testing
Introduction
Shi Min Pan is an accomplished inventor based in Shenzhen, China. He has made significant contributions to the field of nondestructive testing, particularly in the detection of defects in wire ropes. His innovative approach has the potential to enhance safety and reliability in various industrial applications.
Latest Patents
Shi Min Pan holds a patent for a nondestructive testing method and device designed to detect and distinguish internal and external defects in wire ropes. This method involves acquiring magnetic flux and MFL signals from the wire rope, preprocessing these signals, and comparing them against preset thresholds. The process allows for the calculation of defect positions, widths, and cross-sectional area losses, ultimately determining the nature of the defects.
Career Highlights
Shi Min Pan is affiliated with the Harbn Institute of Technology in Shenzhen, which focuses on science and technology innovation. His work at this institute has been pivotal in advancing nondestructive testing methodologies. With a patent count of 1 patent, he continues to push the boundaries of technology in his field.
Collaborations
Shi Min Pan collaborates with notable colleagues, including Dong Lai Zhang and En Chao Zhang. Their combined expertise contributes to the innovative research and development efforts at the Harbn Institute of Technology.
Conclusion
Shi Min Pan's contributions to nondestructive testing exemplify the importance of innovation in ensuring safety and efficiency in industrial applications. His work continues to inspire advancements in technology and research.