The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2023
Filed:
Mar. 17, 2021
Harbin Institute of Technology (Shenzhen) (Institute of Science and Technology Innovation), Shenzhen, CN;
Dong Lai Zhang, Shenzhen, CN;
En Chao Zhang, Shenzhen, CN;
Wei Gao, Shenzhen, CN;
Xiao Lan Yan, Shenzhen, CN;
Shi Min Pan, Shenzhen, CN;
Abstract
A nondestructive testing method for detecting and distinguishing internal and external defects of a wire rope includes: acquiring a magnetic flux signal and a MFL signal of a detected wire rope; preprocessing the magnetic flux signal and the MFL signal of the detected wire rope; comparing a preprocessed magnetic flux signal and a preprocessed MFL signal with a preset magnetic flux signal threshold and a preset MFL signal threshold respectively, and calculating a defect position; extracting a magnetic flux signal of a defect and an MFL signal of the defect based on the defect position; calculating a defect width of the detected wire rope based on the magnetic flux signal of the defect and the MFL signal of the defect; calculating a defect cross-sectional area loss of the detected wire rope based on the defect width; and determining whether the defect is the internal defect or the external defect.