For the Inventor, By the Inventor

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Shenzhen, China

Harbn Institute of Technology (Shenzhen) (Institute of Science and Technology Innovation)

USPTO Granted Patents = 1

Forward Citations = 0

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5 inventors (with patents filed for the assignee):

Wei Gao (1 out of 15 patents)

En Chao Zhang (1 out of 1 patent)

Dong Lai Zhang (1 out of 1 patent)

4. Shi Min Pan (1 out of 1 patent)

5. Xiao Lan Yan (1 out of 1 patent)

1 patent: Sort by Forward Citations

1. 11703477 - Nondestructive testing method and device for detecting and distinguishing internal defect and external defect of wire rope (2023-07-18),

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USPTO Data Jan 1 1976 - Dec 30 2025

1 Patents

#2,657 in Shenzhen

#16,126 in China

Shenzhen, China

Harbn Institute of Technology (Shenzhen) (Institute of Science and Technology Innovation)

Forward Citations = 0

5 inventors:

Wei Gao (1 out of 15 patents)

En Chao Zhang (1 out of 1 patent)

Dong Lai Zhang (1 out of 1 patent)

4. Shi Min Pan (1 out of 1 patent)

5. Xiao Lan Yan (1 out of 1 patent)

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