Irvine, CA, United States of America

Sheng Wan

This inventor holds 1 USPTO granted patent. Top assignee: Thales Visionix, Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sheng Wan. Retrieved from https://idiyas.com/inventor/sheng-wan-eryp0sqr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovations of Sheng Wan

Introduction: Sheng Wan is an accomplished inventor based in Irvine, CA. He has made significant contributions to the field of inertial measurement systems. His work is characterized by a focus on precision and efficiency in measuring inertial properties.

Latest Patents: Sheng Wan holds a patent for an inertial measurement system. This innovative apparatus is designed to measure an inertial property across a set of one or more axes. The system includes a first inertial sensor with a specific resolution and measurement range, as well as a second inertial sensor with a coarser resolution and a larger measurement range. The processing system is capable of receiving signals from both sensors and updating error estimates to enhance measurement accuracy.

Career Highlights: Sheng Wan is currently employed at Thales Visionix, Inc., where he continues to develop cutting-edge technologies in inertial measurement. His expertise in this area has positioned him as a key player in advancing measurement systems.

Collaborations: Sheng Wan collaborates with Eric M Foxlin, a fellow innovator in the field. Their partnership has fostered advancements in inertial measurement technologies.

Conclusion: Sheng Wan's contributions to inertial measurement systems exemplify the importance of innovation in technology. His work not only enhances measurement accuracy but also paves the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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