The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Jun. 03, 2011
Eric Foxlin, Lexington, MA (US);
Sheng Wan, Irvine, CA (US);
Eric Foxlin, Lexington, MA (US);
Sheng Wan, Irvine, CA (US);
Thales Visionix, Inc., Clarksburg, MD (US);
Abstract
An apparatus for measuring an inertial property on a set of one or more axes is disclosed. The apparatus includes a first inertial sensor arranged to measure the inertial property, having a first predetermined resolution and a first predetermined measurement range, and a second inertial sensor arranged to measure the inertial property, having a second predetermined resolution and a second predetermined measurement range. The second resolution is coarser than the first and the second measurement range is larger than the first. A processing system is adapted to receive measurement signals from the first and second inertial sensors and, when the output of the first inertial sensor is within the first predetermined measurement range, to update an error estimate for adjusting the output of the second inertial sensor, based on the measurement signals from the first and second inertial sensors.