Hsin-Chu, Taiwan

Sheng-Hui Liang


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 18(Granted Patents)


Location History:

  • Hsinchu Hsien, TW (2005)
  • Hsin-Chu, TW (2008)
  • Taipei, TW (2021)

Company Filing History:


Years Active: 2005-2021

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3 patents (USPTO):Explore Patents

Title: The Innovations of Sheng-Hui Liang

Introduction

Sheng-Hui Liang is a notable inventor based in Hsin-Chu, Taiwan. He has made significant contributions to the field of semiconductor technology, holding a total of 3 patents. His work focuses on improving the reliability and testing methods of semiconductor devices.

Latest Patents

Liang's latest patents include a reliability determination method and a method for testing semiconductor devices. The reliability determination method is designed to test a batch of semiconductor devices by obtaining a Weibull distribution of their lifetime. It involves dividing this distribution into sections that meet a confidence interval and generating trend lines to predict reliability under target quality levels. The method for testing semiconductor devices involves obtaining breakdown voltages and applying stress voltages to measure currents, ultimately leading to a tailing distribution from the measured currents.

Career Highlights

Throughout his career, Sheng-Hui Liang has worked with prominent companies in the semiconductor industry, including Taiwan Semiconductor Manufacturing Company Ltd. and Vanguard International Semiconductor Corporation. His experience in these organizations has allowed him to develop innovative solutions that enhance semiconductor performance and reliability.

Collaborations

Liang has collaborated with several professionals in his field, including Chia-Lin Chen and Chine-Gie Lou. These collaborations have contributed to the advancement of semiconductor testing and reliability methodologies.

Conclusion

Sheng-Hui Liang's contributions to semiconductor technology through his patents and career achievements highlight his role as an influential inventor in the industry. His innovative methods continue to shape the future of semiconductor reliability and testing.

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