Rehovot, Israel

Shachar Faigenblat

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Applied Materials Israel Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shachar Faigenblat. Retrieved from https://idiyas.com/inventor/shachar-faigenblat

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Shachar Faigenblat: Inventor in Sample-Region Discharge Technology.

Introduction

Shachar Faigenblat is an inventor based in Rehovot, Israel. His listed patent work concerns coordinating laser illumination with electron-beam scanning to discharge a selected region of a sample. He is associated with Applied Materials Israel Limited.

Latest Patents

Faigenblat is credited with 1 patent: “Discharging a Region of a Sample.” The patent describes a system with illumination optics that discharge a sample region by illuminating it with a laser pulse during an illumination iteration. A timing circuit triggers that iteration according to one or more timing constraints associated with an electron beam scanning the region.

Career Highlights

The available information links Faigenblat’s invention to Applied Materials Israel Limited and to technology involving sample processing, laser illumination, and electron-beam scanning. The patent’s timing approach coordinates the illumination with the scanning constraints.

Collaborations

Roey Levy and Alexander Goldenshtein are identified as Faigenblat’s coworkers. The available details do not specify their roles in the patent or the invention.

Conclusion

Shachar Faigenblat’s listed patent focuses on timing laser-based discharge of a sample region in relation to electron-beam scanning, reflecting his association with Applied Materials Israel Limited.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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