Daejeon, South Korea

SeungYeop Ahn

This inventor holds 1 USPTO granted patent. Top assignee: Korea Advanced Institute of Science and Technology. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: SeungYeop Ahn. Retrieved from https://idiyas.com/inventor/seungyeop-ahn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: SeungYeop Ahn and Superlattice Photodetector Innovation.

Introduction

SeungYeop Ahn is an inventor based in Daejeon, South Korea, and is associated with the Korea Advanced Institute of Science and Technology. His work includes a patent for a superlattice photodetector designed to combine a thinner structure with improved performance.

Latest Patents

Ahn’s listed patent is “Superlattice photodetector thinned with improved performance and method of manufacturing the same.” The invention describes a detector with an absorption layer that absorbs incident light and a coupled waveguide layer that guides the light within the absorption layer. The waveguide layer may contain a periodic arrangement of metal and dielectric patterns. The disclosed design aims to reduce the detector’s thickness while improving its performance. Ahn is listed with 1 patent.

Career Highlights

Ahn is associated with the Korea Advanced Institute of Science and Technology, a research institution in Daejeon. His listed patent focuses on photodetector structure and manufacturing.

Collaborations

Jinha Lim and DaeMyeong Geum are identified as Ahn’s coworkers.

Conclusion

SeungYeop Ahn’s listed invention applies a patterned waveguide structure to a superlattice photodetector, with the goal of achieving a thinner device and improved performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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