Suwon, South Korea

Seungho Lee

This inventor holds 15 USPTO granted patents and 10 published patent applications and 1 EPO patent. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Seungho Lee. Retrieved from https://idiyas.com/inventor/seungho-lee-gj4v7va2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 15 

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.3

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2026

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15 patents (USPTO):Explore Patents

Title: Seungho Lee - Innovator in Semiconductor Equipment Abnormality Detection

Introduction

Seungho Lee is an inventor based in Suwon-si, South Korea. He has made significant contributions to the field of semiconductor equipment through his innovative approaches. Although he currently holds no granted patents, his work in developing methods for detecting abnormalities in semiconductor equipment showcases his expertise and potential in the industry.

Latest Patent Applications

Seungho Lee's latest patent application is titled "METHOD, DEVICE, AND SYSTEM FOR DETECTING ABNORMALITY OF SEMICONDUCTOR EQUIPMENT." This application outlines a method performed by a computing system to detect abnormalities. The method includes generating a plurality of training data sets from the history data of various pieces of equipment. It also involves creating machine learning models based on these training data sets, determining inefficiency indices for the equipment, and identifying abnormal equipment based on these indices.

Conclusion

Seungho Lee's innovative approach to semiconductor equipment monitoring highlights his potential as an inventor in the field. His latest patent application reflects a commitment to advancing technology and improving equipment reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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