Seoul, South Korea

Seung-Yong Doh

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Seung-Yong Doh. Retrieved from https://idiyas.com/inventor/seung-yong-doh-gd244fvc

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Seung-Yong Doh: Innovator in Sensor Data Compensation

Introduction

Seung-Yong Doh is a prominent inventor based in Seoul, South Korea. He is known for his contributions to the field of sensor technology, particularly in enhancing the reliability of wafer detection systems. His innovative approach has led to significant advancements in the industry.

Latest Patents

Seung-Yong Doh holds a patent for a "Method of compensating sensor data and evaluating an interlock of an interlock system." This method focuses on minimizing allowable variations between sensors, which depend on various factors such as driving time, RF time, and the number of wafers. By addressing these variations, his invention enhances the detection reliability of defective wafers, making it a valuable asset in semiconductor manufacturing.

Career Highlights

Doh is currently employed at Samsung Electronics Co., Ltd., a leading global technology company. His work at Samsung has allowed him to apply his innovative ideas in a practical setting, contributing to the company's reputation for excellence in technology and innovation.

Collaborations

Seung-Yong Doh has collaborated with notable colleagues, including Seung-Jun Lee and Hak-yong Kim. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Seung-Yong Doh's contributions to sensor technology and his innovative patent demonstrate his commitment to enhancing the reliability of semiconductor processes. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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