Seoul, South Korea

Seung Yob Kim

This inventor holds 1 USPTO granted patent. Top assignee: Inus Technology, Inc.. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Seung Yob Kim. Retrieved from https://idiyas.com/inventor/seung-yob-kim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: The Innovations of Seung Yob Kim

Introduction: Seung Yob Kim is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of technology, particularly in the area of 3D scanning and analysis. His work focuses on improving the efficiency and accuracy of inspection processes through innovative methods.

Latest Patents: Seung Yob Kim holds a patent for a "System and method for recalculating analysis report of 3D scan data." This invention allows for the analysis results of scan data to incorporate supplemental geometry and various measurements. The system is designed to recalculate analysis results in real time when scan data changes, thereby simplifying the repetitive inspection process.

Career Highlights: Seung Yob Kim is associated with Inus Technology, Inc., where he applies his expertise in developing advanced technological solutions. His work has been instrumental in enhancing the capabilities of 3D scanning technologies.

Collaborations: Some of his notable coworkers include Seock Hoon Bae and Dong Hoon Lee, who contribute to the innovative environment at Inus Technology, Inc.

Conclusion: Seung Yob Kim's contributions to the field of 3D scanning and analysis exemplify the impact of innovative thinking in technology. His patent reflects a commitment to improving inspection processes, showcasing the importance of continuous advancement in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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