The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2008
Filed:
Nov. 21, 2005
Applicants:
Seock Hoon Bae, Gyeonggi, KR;
Dong Hoon Lee, Seoul, KR;
Seung Yob Kim, Seoul, KR;
Sung Woo Cho, Gyeonggi, KR;
Inventors:
Seock Hoon Bae, Gyeonggi, KR;
Dong Hoon Lee, Seoul, KR;
Seung Yob Kim, Seoul, KR;
Sung Woo Cho, Gyeonggi, KR;
Assignee:
Inus Technology, Inc., , KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
Disclosed is a system and method for allowing analysis results of scan data to have supplemental geometry and various measurements generated from the supplemental geometry or mutual common relations between geometric tolerances, and when the scan data changes, the analysis results according to the related data are recalculated in real time in order to simplify the repetitive inspection process according to the scan data changes.