Yongin-si, South Korea

Seung-Se Lee


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Seung-Se Lee: Innovator in Mass Analyzer Technology

Introduction: Seung-Se Lee, an accomplished inventor based in Yongin-si, South Korea, has made significant contributions to the field of mass analysis. His innovative approach to enhancing mass analyzer technology has led to the development of a unique patent that addresses critical challenges in the field.

Latest Patents: Seung-Se Lee holds a patent for an "Analyzing chamber including a leakage ion beam detector and mass analyzer including the same." This innovative patent outlines the design of an analyzing chamber for a mass analyzer, which includes an inlet for ion beam entry and an outlet for ion beam exit. One of the key features of this invention is a shielding section, which is installed on the sidewall to prevent potential damage caused by the ion beam traveling within the chamber. Additionally, a detector is positioned between the sidewall and shielding section to identify any ion beam leakage, thereby significantly reducing or preventing damage to the analyzing chamber's structure.

Career Highlights: Seung-Se Lee is affiliated with Samsung Electronics Co., Ltd., a prominent player in the technology sector. His work at Samsung highlights his role in advancing mass analysis technology, showcasing his commitment to innovation and excellence in research and development.

Collaborations: Throughout his career, Seung-Se Lee has had the honor of collaborating with talented individuals such as Hyun-Sub Earm and Young-Dae Kim. These collaborations have fostered a rich environment for innovative thinking and problem-solving, further contributing to advancements in technology.

Conclusion: Seung-Se Lee's inventive spirit and dedication to enhancing mass analyzer technology are evident in his significant patent. His collaboration with esteemed colleagues at Samsung Electronics Co., Ltd. positions him as a key figure in the field of innovation. With a focus on reducing damage caused by ion beams, his work not only advances scientific understanding but also paves the way for future innovations in mass analysis technologies.

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