The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2009
Filed:
Jul. 20, 2006
Hyun-sub Earm, Hwaseong-si, KR;
Seung-se Lee, Yongin-si, KR;
Young-dae Kim, Yongin-si, KR;
Gon-su Kang, Gumi-si, KR;
Sung-yeul an, Gyeongju-si, KR;
Hyun-Sub Earm, Hwaseong-si, KR;
Seung-Se Lee, Yongin-si, KR;
Young-Dae Kim, Yongin-si, KR;
Gon-Su Kang, Gumi-si, KR;
Sung-Yeul An, Gyeongju-si, KR;
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Abstract
In an analyzing chamber for a mass analyzer, a body of the analyzing chamber may include an inlet through which an ion beam enters and an outlet through which the ion beam leaves. A shielding section may be installed on a sidewall. The shielding section may prevent the ion beam traveling along a path in the body from causing damage to the sidewall of the body. A detector may be interposed between the sidewall of the body and the shielding section. The detector may detect an ion beam leaking through the shielding section. Accordingly, damage to the sidewall of the body may be sufficiently reduced and/or prevented.