This inventor holds 2 USPTO granted patents. Top assignee: Iowa State University Research Foundation Inc.. Active years: 1990-1993.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1990-1993
Title: Seung S Lee: Innovator in Ultrasonic Measurement Technology
Introduction
Seung S Lee is a notable inventor based in Taejon Ch'ungmam, South Korea. He has made significant contributions to the field of ultrasonic measurement technology, particularly in the context of metal plates and sheets. With a total of 2 patents, his work has enhanced the reliability and accuracy of texture measurement in various industrial applications.
Latest Patents
Lee's latest patents include a "Method of Ultrasonic Measurement of Texture" and a "Semi-Automatic for Ultrasonic Measurement of Texture." Both methods focus on non-destructive ultrasonic investigation techniques. They involve measuring the velocity of ultrasonic energy waves in lower order plate modes and, if necessary, measuring phase velocity dispersion of higher order modes. These innovative methods allow for the derivation of texture or preferred grain orientation, which significantly improves measurement reliability and accuracy. Furthermore, these techniques can be utilized in production settings on moving metal plates or sheets.
Career Highlights
Seung S Lee is affiliated with the Iowa State University Research Foundation Inc., where he continues to advance his research and development efforts. His work has been instrumental in bridging the gap between theoretical research and practical applications in the field of materials science.
Collaborations
Lee has collaborated with esteemed colleagues such as John F Smith and R Bruce Thompson. Their combined expertise has contributed to the successful development of innovative measurement techniques.
Conclusion
Seung S Lee's contributions to ultrasonic measurement technology exemplify the impact of innovative thinking in industrial applications. His patents reflect a commitment to enhancing measurement accuracy and reliability, paving the way for advancements in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile