The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 1993
Filed:
Aug. 03, 1992
Applicant:
Inventors:
R Bruce Thompson, Ames, IA (US);
John F Smith, Ames, IA (US);
Seung S Lee, Taejon Ch'ungmam, KR;
Yan Li, Ames, IA (US);
Assignee:
Iowa State University Research Foundation, Inc., Ames, IA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73597 ; 73602 ;
Abstract
A method for measuring texture of metal plates or sheets using non-destructive ultrasonic investigation includes measuring the velocity of ultrasonic energy waves in lower order plate modes in one or more directions, and measuring phase velocity dispersion of higher order modes of the plate or sheet if needed. Texture or preferred grain orientation can be derived from these measurements with improves reliability and accuracy. The method can be utilized in production on moving metal plate or sheet.