This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Chep Technology Pty Limited. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Innovations by Sergio Conejo in Pallet Inspection Technology
Introduction
Sergio Conejo is an innovative inventor based in Madrid, Spain. He has made significant contributions to the field of pallet inspection technology. His work focuses on enhancing the efficiency and accuracy of pallet inspections through advanced systems and methods.
Latest Patents
Sergio Conejo holds a patent for a "Pallet inspection system and associated methods." This system includes a conveyor designed to move pallets for inspection. The pallets consist of a top deck and a bottom deck, separated by spaced support blocks. Nails secure the top and bottom decks to these support blocks. The system employs cameras to generate images of the pallet as it moves along the conveyor. A processor is connected to the cameras, receiving and processing the images. The processing involves executing a first algorithm to tag images with visible support blocks and a second algorithm to detect nails with exposed tips. This innovative approach significantly improves the inspection process.
Career Highlights
Sergio Conejo is associated with Chep Technology Pty Limited, where he applies his expertise in developing advanced inspection systems. His work has been instrumental in enhancing the operational efficiency of pallet management.
Collaborations
Sergio collaborates with talented professionals such as Khurram Soomro and Christopher J Gerou. Their combined efforts contribute to the advancement of technology in pallet inspection.
Conclusion
Sergio Conejo's contributions to pallet inspection technology demonstrate his commitment to innovation and efficiency. His patent and collaborative efforts reflect a dedication to improving industry standards.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
