The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Oct. 11, 2022
Applicant:

Chep Technology Pty Limited, Sydney, AU;

Inventors:

Khurram Soomro, Ocoee, FL (US);

Christopher J. Gerou, Orlando, FL (US);

Sergio Conejo, Madrid, ES;

Moazam Soomro, Orlando, FL (US);

Gonzalo Vaca Castano, Orlando, FL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); B65G 43/08 (2006.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); B65G 43/08 (2013.01); G06V 10/764 (2022.01); B65G 2201/0267 (2013.01); B65G 2203/0208 (2013.01); B65G 2203/041 (2013.01); B65G 2203/044 (2013.01); G06T 2207/30136 (2013.01);
Abstract

A pallet inspection system includes a conveyor to move a pallet that is to be inspected. The pallet includes a top deck and a bottom deck separated by spaced apart support blocks positioned therebetween, with nails being used to secure the top and bottom decks to the support blocks. Cameras are positioned to generate images of the pallet as the pallet is moved on the conveyor. A processor is coupled to the cameras and receives the images for processing. The processing includes executing a first algorithm on the images to tag the images having support blocks visible therein, and executing a second algorithm on the tagged images to detect nails having exposed tips.


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