Saint-Petersburg, Russia

Sergey Kholchanskiy

This inventor holds 1 USPTO granted patent. Top assignee: Prompribor, Inc.. Active years: 2009.


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2009

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Sergey Kholchanskiy: Innovator in Measurement Technology

Introduction

Sergey Kholchanskiy is a notable inventor based in St. Petersburg, Russia. He has made significant contributions to the field of measurement technology, particularly in the development of systems for assessing parameters in sheet-like objects.

Latest Patents

Kholchanskiy holds a patent for a "System and method to measure parameters distribution in sheet-like objects." This innovative measuring device and method are designed to measure parameter distribution over the entire surface of sheet-like objects. The primary parameters of interest include thickness and permeability profiles. The device features a parameter measuring unit, a coordinate measuring unit, and a synchronization unit that controls the operation of both measuring units. The coordinate measuring unit determines the device's position on a two-dimensional surface using image correlation analysis. Additionally, the measuring device includes a platform for movement across the plane of the sheet-like object.

Career Highlights

Kholchanskiy is associated with Prompribor, Inc., where he applies his expertise in measurement technology. His work has been instrumental in advancing the capabilities of measurement devices used in various applications.

Collaborations

Some of Kholchanskiy's coworkers include Victor Milovidov and Victor Preobrazhenskiy, who contribute to the innovative environment at Prompribor, Inc.

Conclusion

Sergey Kholchanskiy is a prominent inventor whose work in measurement technology has led to significant advancements in the field. His patent for measuring parameters in sheet-like objects showcases his innovative approach and dedication to improving measurement systems.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…