The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2009
Filed:
Apr. 24, 2007
Sergey Kholchanskiy, St. Petersburg, RU;
Victor Preobrazhenskiy, St. Petersburg, RU;
Igor Zelenyak, St. Petersburg, RU;
Victor Milovidov, St. Petersburg, RU;
Nadejda Reingand, Baltimore, MD (US);
Sergey Kholchanskiy, St. Petersburg, RU;
Victor Preobrazhenskiy, St. Petersburg, RU;
Igor Zelenyak, St. Petersburg, RU;
Victor Milovidov, St. Petersburg, RU;
Nadejda Reingand, Baltimore, MD (US);
Prompribor, Inc., St. Petersburg, RU;
Abstract
A measuring device and method are disclosed for parameter distribution measurement over the entire surface of sheet-like objects. The parameters of primary interest are thickness and permeability profiles. The device includes a parameter measuring unit a coordinate measuring unit and a synchronization unit to control operation of the parameter measuring unit and the coordinate measuring unit. The coordinate measuring unit determines the measuring device position on two-dimensional surface using image correlation analysis. The measuring device further comprises a platform for its movement in the plane of the sheet-like object.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile