This inventor holds 1 USPTO granted patent. Top assignee: United Semiconductor (Xiamen) Co., Ltd.. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Sen-Chih Chang: Innovator in Wafer Detection Technology
Introduction
Sen-Chih Chang is a notable inventor based in Tainan, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the detection of defects in wafer surfaces. His innovative approach has the potential to enhance the quality control processes in semiconductor manufacturing.
Latest Patents
Sen-Chih Chang holds a patent for a "Method for detecting back surface of wafer." This invention provides a systematic approach to identifying defects on the back surface of a wafer. The method involves capturing a gray scale map of the wafer's back surface, analyzing deviations in the map to locate defects, and transmitting this data to a system for further judgment and analysis. This patent represents a significant advancement in wafer inspection technology.
Career Highlights
Sen-Chih Chang is currently employed at United Semiconductor (Xiamen) Co., Ltd. His work at this company has allowed him to apply his innovative ideas in a practical setting, contributing to the advancement of semiconductor technology. His expertise in wafer detection has positioned him as a valuable asset in the industry.
Collaborations
Throughout his career, Sen-Chih has collaborated with talented individuals such as Chen Feng Wang and Ching-Shu Lo. These collaborations have fostered an environment of innovation and have led to the development of cutting-edge technologies in the semiconductor field.
Conclusion
Sen-Chih Chang's contributions to wafer detection technology exemplify the impact of innovation in the semiconductor industry. His patent and collaborative efforts highlight the importance of continuous improvement in manufacturing processes. His work is a testament to the advancements being made in technology today.