Tokyo, Japan

Seiichiro Hasezawa

This inventor holds 1 USPTO granted patent. Top assignee: The University of Tokyo. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Seiichiro Hasezawa. Retrieved from https://idiyas.com/inventor/seiichiro-hasezawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Seiichiro Hasezawa: Innovator in Image Classification Technology

Introduction

Seiichiro Hasezawa is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of image classification technology. His innovative work has led to the development of a unique method and apparatus for feature quantity selection.

Latest Patents

Hasezawa holds a patent for a "Feature quantity selection method, feature quantity selection apparatus, image classification method, image classification apparatus, computer program, and recording medium." This invention involves a control unit within an image classification apparatus that performs clustering of training images based on various feature quantities. The method selects a classification-use combination pattern from the clustered results, enhancing the accuracy of image classification.

Career Highlights

Hasezawa is affiliated with the University of Tokyo, where he continues to advance research in image processing and classification technologies. His work is recognized for its practical applications in various industries, including artificial intelligence and machine learning.

Collaborations

He has collaborated with notable colleagues such as Natsumaro Kutsuna and Takumi Higaki, contributing to the advancement of their shared research interests.

Conclusion

Seiichiro Hasezawa's contributions to image classification technology exemplify the innovative spirit of modern research. His patent reflects a significant advancement in the field, showcasing the potential for future developments in image processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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