The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2012
Filed:
Apr. 18, 2008
Seiichiro Hasezawa, Tokyo, JP;
Natsumaro Kutsuna, Tokyo, JP;
Takumi Higaki, Tokyo, JP;
Satihiro Matsunaga, Suita, JP;
Susumu Uchiyama, Suita, JP;
Rika Maniwa, Suita, JP;
Arni Eguna Gambe, Suita, JP;
Kiichi Fukui, Suita, JP;
Seiichiro Hasezawa, Tokyo, JP;
Natsumaro Kutsuna, Tokyo, JP;
Takumi Higaki, Tokyo, JP;
Satihiro Matsunaga, Suita, JP;
Susumu Uchiyama, Suita, JP;
Rika Maniwa, Suita, JP;
Arni eguna Gambe, Suita, JP;
Kiichi Fukui, Suita, JP;
The University of Tokyo, Tokyo, JP;
Abstract
A control unit () included in an image classification apparatus of the present invention performs a step of clustering a plurality of training images for each of a plurality of combination patterns of a plurality of feature quantities that an image has, and a step of selecting, from among the plurality of combination patterns, a classification-use combination pattern to be used in image classification, based on a result of the clustering. The clustering is performed based on degrees of similarity between the training images that have been calculated with use of the feature quantities constituting the combination patterns.