This inventor holds 1 USPTO granted patent. Top assignee: National Aerospace Laboratory of Science Technology Agency. Active years: 2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001
Title: Seigou Nakamura: Innovator in Flight Velocity Measurement Systems
Introduction
Seigou Nakamura is a prominent inventor based in Mitaka, Japan. He has made significant contributions to the field of aerospace technology, particularly in the measurement of flight velocity vectors. His innovative work has led to the development of a unique system that enhances the accuracy of flight measurements.
Latest Patents
Nakamura holds a patent for a "Flight velocity vector measuring system in wide velocity region using truncated pyramid-shape probe." This system is designed to measure flight velocity vectors across a wide range of velocities. It utilizes a square truncated pyramid-shaped probe to detect five pressure information points, which are essential for calculating various pressure coefficients. These coefficients are then used in a polynomial approximation to determine the flight velocity vectors, including Mach number, attack angle, and sideslip angle.
Career Highlights
Seigou Nakamura is affiliated with the National Aerospace Laboratory of Science Technology Agency, where he has been instrumental in advancing aerospace measurement technologies. His work has not only contributed to theoretical advancements but has also practical implications for flight safety and performance.
Collaborations
Nakamura has collaborated with notable colleagues, including Naoaki Kuwano and Asao Hanzawa. Their combined expertise has further enriched the research and development efforts in the field of aerospace technology.
Conclusion
Seigou Nakamura's innovative contributions to flight velocity measurement systems exemplify the importance of precision in aerospace technology. His patent and collaborative efforts continue to influence advancements in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile