The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2001

Filed:

Jan. 08, 1998
Applicant:
Inventors:

Teruomi Nakaya, Machida, JP;

Naoaki Kuwano, Chofu, JP;

Seigou Nakamura, Mitaka, JP;

Asao Hanzawa, Hachioji, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 2/100 ;
U.S. Cl.
CPC ...
G01C 2/100 ;
Abstract

A flight velocity vector measuring system in a wide velocity region in which an attack angle pressure coefficient C&agr; of air current, a sideslip angle pressure coefficient C&bgr; and an air current angle pressure coefficient C&ggr; are obtained from five pressure information detected by a square truncated pyramid-shape probe. The aforementioned pressure coefficients, pressure calibration coefficients with respect to a Mach number M, an attack angle &agr; and a sideslip angle &bgr; every velocity region obtained by dividing the wide velocity region into a plurality of regions stored in advance in the calculation processor, and a Mach number M, an attack angle &agr; and a sideslip angle &bgr; of unknown quantity constitute a calculation processing expression comprising a polynomial approximation to call the pressure calibration coefficients in the velocity region, and flight velocity vectors (M, &agr;, &bgr;) are calculated by the polynomial approximation.


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