Seigo Ohno

Title: Seigo Ohno: Innovator in Semiconductor Measurement Technologies

Introduction

Seigo Ohno is a notable inventor based in Wako, Japan, recognized for his contributions to semiconductor measurement technologies. With a focus on mobility and carrier concentration measurement, he has developed innovative devices that enhance the understanding of semiconductor properties. His work has led to the filing of 2 patents that reflect his expertise in this specialized field.

Latest Patents

Ohno's latest patents include a mobility measuring apparatus and a resistivity measuring apparatus. The mobility measuring apparatus features a storage unit that stores relationships between the mobility of carriers in a semiconductor and their decay constants. It also includes a light radiating unit that emits terahertz light to the semiconductor sample, a detecting unit for reflected light, and a mobility calculating unit that derives the mobility from the obtained decay constant. The resistivity measuring apparatus is designed for nondestructive carrier concentration measurement, utilizing a correlation between reflectance and carrier concentration to provide accurate readings.

Career Highlights

Throughout his career, Seigo Ohno has worked with prominent companies such as Riken Corporation and Furukawa Co., Ltd. His experience in these organizations has contributed to his development of advanced measurement technologies in the semiconductor industry.

Collaborations

Ohno has collaborated with notable colleagues, including Hiromasa Ito and Akihide Hamano. Their combined expertise has fostered innovation and progress in semiconductor research and development.

Conclusion

Seigo Ohno's contributions to semiconductor measurement technologies through his patents and collaborations highlight his significant role in advancing the field. His innovative approaches continue to influence the understanding and application of semiconductor properties.