The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2013

Filed:

Dec. 11, 2008
Applicants:

Hiromasa Ito, Saitama, JP;

Seigo Ohno, Saitama, JP;

Akihide Hamano, Ibaraki, JP;

Inventors:

Hiromasa Ito, Saitama, JP;

Seigo Ohno, Saitama, JP;

Akihide Hamano, Ibaraki, JP;

Assignees:

Riken, Saitama, JP;

Furukawa Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A nondestructive carrier concentration measuring device () includes: a storage unit () that stores a correlation between the reflectance of an inorganic compound semiconductor against terahertz light and a carrier concentration; a light radiation unit () that irradiates the terahertz light () to the inorganic compound semiconductor as a sample; a detection unit () that detects reflected light () of the inorganic compound semiconductor against the irradiated terahertz light (); a reflectance calculation unit () that compares the irradiated terahertz light () with the reflected light () and calculates an actual measurement value of the reflectance of the inorganic compound semiconductor; and a read unit () that refers to the stored correlation and reads the carrier concentration of the sample corresponding to the actual measurement value of the reflectance.


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