Takatsuki, Japan

Seigo Inamine

This inventor holds 1 USPTO granted patent. Top assignee: Omron Corporation. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Seigo Inamine. Retrieved from https://idiyas.com/inventor/seigo-inamine

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Seigo Inamine: Innovator in Waveform Shaping Technology

Introduction

Seigo Inamine is a notable inventor based in Takatsuki, Japan. He has made significant contributions to the field of waveform shaping technology. His innovative approach has led to the development of a unique patent that enhances signal processing.

Latest Patents

Inamine holds a patent for a "Method of and apparatus for shaping waveform." This patent includes a comprehensive method that detects various characteristics of an input signal, such as signal time width, peak value level, and signal failure time width. The process involves converting detected values into function values, conducting computations on these values, and determining logical values based on a predetermined threshold.

Career Highlights

Seigo Inamine is associated with Omron Corporation, a leading company in automation and control technology. His work at Omron has allowed him to focus on innovative solutions that improve signal processing and waveform shaping.

Collaborations

Inamine collaborates with Tomohiko Hayakawa, a fellow innovator in the field. Their partnership has fostered advancements in technology and has contributed to the success of their projects.

Conclusion

Seigo Inamine's contributions to waveform shaping technology exemplify the impact of innovation in signal processing. His patent and work at Omron Corporation highlight his role as a key figure in this specialized field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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