The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 1993

Filed:

Jun. 14, 1991
Applicant:
Inventors:

Tomohiko Hayakawa, Nagaokakyo, JP;

Seigo Inamine, Takatsuki, JP;

Assignee:

Omron Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L / ; H04L / ;
U.S. Cl.
CPC ...
375 17 ; 375 22 ; 375 76 ; 375 95 ; 307234 ; 307358 ;
Abstract

A waveform shaping method including a step of detecting at least two items selected from three items i.e. a signal time width, a peak value level, and a signal failure time width of an input signal in a unit time length, a step of converting for each of the detected items a detected value into a function value based on a function representing likelihood of a logical value '1' or '0', a step of conducting a predetermined computation on the converted function values related to the at least two items to attain a result, and a step of discriminating the result of the computation by a predetermined threshold value to determine a logical value '1' or '0' for the input signal in the unit time length.


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