Walluf, Germany

Sebastian Toelg


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: The Innovations of Sebastian Toelg

Introduction

Sebastian Toelg is a notable inventor based in Walluf, Germany. He has made significant contributions to the field of micromechanical sensors, particularly with his innovative designs that enhance the accuracy and functionality of acceleration measurement devices.

Latest Patents

Toelg holds a patent for a micromechanical capacitive acceleration sensor. This sensor is designed to detect the acceleration of an object in at least one direction. It features a frame structure and a sensor inertia mass made from a wafer, which is movably mounted relative to the frame structure about a rotation axis. The capacitive pick-up unit produces at least one capacitive output signal that represents the position of the sensor mass relative to the frame structure. The design includes a center of gravity that is offset relative to the rotation axis, allowing for the measurement of lateral accelerations. Both the sensor mass and the frame structure are made monolithically from a single crystal silicon wafer, ensuring precision and reliability in its operation.

Career Highlights

Toelg is currently employed at Conti Temic Microelectronic GmbH, where he continues to develop advanced technologies in the field of microelectronics. His work has been instrumental in pushing the boundaries of sensor technology, making significant strides in the industry.

Collaborations

Throughout his career, Toelg has collaborated with talented individuals such as Konrad Kapser and Peter Knittl. These partnerships have fostered innovation and have contributed to the successful development of various projects.

Conclusion

Sebastian Toelg's contributions to micromechanical sensor technology exemplify the spirit of innovation in the field. His patented designs and collaborative efforts continue to influence advancements in acceleration measurement devices.

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