Paderborn, Germany

Sebastian Graf

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Dspace Se & Co. Kg. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sebastian Graf. Retrieved from https://idiyas.com/inventor/sebastian-graf-1cvd4xxa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sebastian Graf and Distance-Sensor Testing

Introduction

Sebastian Graf is an inventor associated with Paderborn, Germany, and Dspace SE & Co. KG. His patent work concerns testing distance sensors that operate using electromagnetic waves.

Latest Patents

The provided information lists one patent for Graf: “Testing Device for Testing a Distance Sensor That Operates Using Electromagnetic Waves.” The device receives an electromagnetic free-space wave and emits an electromagnetic output signal. In simulation mode, its signal-processing unit applies a predefined, constant time delay to a received sensor signal, producing a delayed signal that simulates a reflection. This approach supports testing distance sensors with temporally coherent, limited-duration signals.

Career Highlights

Graf’s listed patent reflects work on sensor-testing technology and signal processing. He is associated with Dspace SE & Co. KG, a company working in the engineering and testing technology field. The supplied information attributes 1 patent to him.

Collaborations

The provided data names Christian Hohenbrink and Chris Hoffmann as Graf’s coworkers. It does not specify whether they collaborated with him on this patent.

Conclusion

Sebastian Graf’s listed invention uses controlled signal delays to simulate reflections, offering a method for testing electromagnetic distance sensors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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