The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Jul. 12, 2022
Dspace Gmbh, Paderborn, DE;
Sebastian Graf, Paderborn, DE;
Christian Hohenbrink, Paderborn, DE;
Chris Hoffmann, Zwiesel, DE;
Tim Fisch, Paderborn, DE;
dSPACE SE & Co. KG, Paderborn, DE;
Abstract
A testing device for testing a distance sensor includes: a receiving element for receiving an electromagnetic free-space wave as a received signal; an emission element for emitting an electromagnetic output signal; and a signal processing unit. During a simulation operation, the received signal or a received signal derived from the received signal is guided via a signal processing unit with a predefinable time delay to form a time-delayed signal as a simulated reflection signal. The signal processing unit is configured to fully process a received temporally coherent and temporally limited sensor signal or a received temporally coherent and temporally limited sensor signal derived from the received sensor signal in a delay step with the predefinable time delay as a constant working time delay to form a time-delayed sensor signal, wherein the predefinable time delay was predefined at the start of the delay step.