Miami, FL, United States of America

Sebastian Brunet

This inventor holds 1 USPTO granted patent. Top assignee: Dell Products Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sebastian Brunet. Retrieved from https://idiyas.com/inventor/sebastian-brunet

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sebastian Brunet: Inventor in Machine-Learning-Based Incident Detection

Introduction

Sebastian Brunet is an inventor based in Miami, Florida, whose patent work includes applying machine-learning techniques to incident management. He is associated with Dell Products Inc. His listed portfolio includes 1 patent.

Latest Patents

Brunet’s patent, “Detecting Duplicate Incidents Using Machine Learning Techniques,” describes methods and systems for identifying incidents that may be duplicates in an incident database. The process uses machine-learning models to generate a summary of an incident and create an embedding from that summary. It then calculates similarity scores to assess whether the incident matches other records and may initiate updates to the database based on the result.

Career Highlights

The available information identifies Brunet as an inventor associated with Dell Products Inc. His patent focuses on using machine learning to help detect duplicate incident records, potentially supporting more consistent incident tracking and database management.

Collaborations

The patent is associated with Dell Products Inc. The provided information does not identify additional collaborators.

Conclusion

Sebastian Brunet’s patent work highlights a machine-learning approach to detecting duplicate incidents and improving the handling of incident database records.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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