Henniker, NH, United States of America

Sean David Griffin

This inventor holds 1 USPTO granted patent. Top assignee: Labsphere, Inc.. Active years: 2004.


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Sean David Griffin: Innovator in Light-Emitting Device Testing

Introduction

Sean David Griffin is a notable inventor based in Henniker, NH (US). He has made significant contributions to the field of light-emitting devices, particularly through his innovative patent that enhances the testing process of these devices.

Latest Patents

Griffin holds a patent for a "Prober for testing light-emitting devices on a wafer." This invention is designed to measure the light output of digital devices that are integrally formed on a single wafer. The prober features a light-integrating sphere that is sequentially aligned with selected devices. Each time a device is aligned with the sphere, it is activated, allowing for the individual measurement of the light output from each device. The disclosed embodiment of this invention includes vertical cavity surface emitting lasers (VCSELs) and light-emitting diodes (LEDs). He has 1 patent to his name.

Career Highlights

Sean David Griffin has established himself as a key figure in the field of optical testing technologies. His work at Labsphere, Inc. has been instrumental in advancing the capabilities of light-emitting device testing. His innovative approach has paved the way for more efficient and accurate measurements in the industry.

Collaborations

Griffin has collaborated with notable colleagues, including David J Griffiths and Jonathan D Scheuch. These partnerships have contributed to the development and refinement of his inventions, enhancing their impact in the field.

Conclusion

Sean David Griffin's contributions to the testing of light-emitting devices demonstrate his innovative spirit and commitment to advancing technology. His patent reflects a significant step forward in the measurement of digital devices, showcasing his expertise and dedication to the field.

Profile summary based on public USPTO records.
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